“State of the Art in Modeling and Measuring of Surface Reflection” by Ashikhmin, Shirley, Marschner and Stam

  • ©Michael Ashikhmin, Peter Shirley, Steve Marschner, and Jos Stam

Conference:


Entry Number: 10

Title:

    State of the Art in Modeling and Measuring of Surface Reflection

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Abstract:


    Prerequisites
    Familiarity with BRDF formalism and currently used reflection models. Good understanding of the basic physics of light-surface interaction and the fundamental principles of both geometric and wave optics. 

    Topics
    Fundamentals and different types of simple reflectance measurements. Traditional and image-based BRDF measurement techniques. Reflection models based on the wave theory of light. Models that account for subsurface scattering. The microfacet theory of surface reflectance. Recent empirical models. 

    Description
    Surface appearance is at the heart of computer graphics. At the lowest level, it is controlled by the surface bi-directional reflectance distribution function (BRDF), which describes how much light incident from a given direction is being scattered in another direction. Both measuring and modeling of this function have a long history, and active research is continuing. The main goal of the course is to provide a snapshot of the most recent results from the computer graphics community. 

     

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