“Multi-Touch Sensing through Frustrated Total Internal Reflection” by Han
Conference:
Type(s):
Title:
- Multi-Touch Sensing through Frustrated Total Internal Reflection
Session/Category Title: Interfaces
Presenter(s)/Author(s):
Abstract:
While touch sensing is commonplace for single points of contact, it is still relatively difficult and/or expensive to construct a touch sensor that can register multiple points of contact simultaneously by one or more users. We introduce here a new technique that enables robust multi-touch sensing at a minimum of engineering effort and expense. It relies on a phenomenon known as frustrated total internal reflection (FTIR), a technique well known in the biometrics community for fingerprint acquisition. It captures true touch information at high spatial and temporal resolutions, and is trivially scalable to large installations.
