“Processing and editing of faces using a measurement-based skin reflectance model” by Bickel, Weyrich, Matusik, Pfister, Donner, et al. …
Conference:
Type:
Title:
- Processing and editing of faces using a measurement-based skin reflectance model
Presenter(s)/Author(s):
Abstract:
No abstract available.
References:
1. Jensen, H. W., Marschner, S. R., Levoy, M., and Hanrahan, P. 2001. A practical model for subsurface light transport. In Proc. SIGGRAPH ’01, ACM Press, 511–518.
2. Nehab, D., Rusinkiewicz, S., Davis, J., and Ramamoorthi, R. 2005. Efficiently combining positions and normals for precise 3d geometry. ACM Trans. Graph. 24, 3, 536–543.
