“Processing and editing of faces using a measurement-based skin reflectance model” by Bickel, Weyrich, Matusik, Pfister, Donner, et al. …
Conference:
Type(s):
Title:
- Processing and editing of faces using a measurement-based skin reflectance model
Session/Category Title: About Face
Presenter(s)/Author(s):
Abstract:
An almost fully automated processing pipeline, including a custom- built acquisition system, calibration procedures, and rendering for human faces. The underlying model is intuitive, physically plausible, and allows easy face editing. This sketch provides implementation details on the SIGGRAPH 2006 paper: Analysis of Human Faces Using a Measurement-Based Skin Reflectance Model.
References:
1. Jensen, H. W., Marschner, S. R., Levoy, M., and Hanrahan, P. 2001. A practical model for subsurface light transport. In Proc. SIGGRAPH ’01, ACM Press, 511–518.
2. Nehab, D., Rusinkiewicz, S., Davis, J., and Ramamoorthi, R. 2005. Efficiently combining positions and normals for precise 3d geometry. ACM Trans. Graph. 24, 3, 536–543.
