“Measured Curvature-Dependent Reflectance Function for Synthesizing Translucent Materials in Real-time” by Okamoto, Adachi, Ukaji, Okami and Morishima
Conference:
Type(s):
Entry Number: 62
Title:
- Measured Curvature-Dependent Reflectance Function for Synthesizing Translucent Materials in Real-time
Presenter(s)/Author(s):
Abstract:
Simulating the effects of sub-surface scattering is one of the most important factors for synthesizing realistic translucent materials. “Curvature-Dependent Reflectance Function (CDRF)” proposed by Kubo et al. [2010] enables to represent the effects of subsurface scattering in real-time, according to the correlation between curvature and translucency. Since CDRF is an approximation of scattering effects using Gauss function, whole details of the effect cannot be represented.
To represent the effects of sub-surface scattering, that cannot be approximated using Gauss function, we propose measured CDRF, acquired from real objects. Using a digital camera and polarizers, we obtain the correlation between curvature and scattering effect, then store it as a look-up-table. As a result, we are able to realize real-time rendering of translucent materials from measured CDRF.
References:
- Kubo, H., Dobashi, Y., and Morishima, S. 2010. Curvature-Dependent Reflectance Function for Rendering Translucent Materials. SIGGRAPH’10, Article 46.
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