“A two-scale microfacet reflectance model combining reflection and diffraction” by Holzschuch and Pacanowski
Conference:
Type(s):
Title:
- A two-scale microfacet reflectance model combining reflection and diffraction
Session/Category Title: Reflectance & Scattering
Presenter(s)/Author(s):
Moderator(s):
Abstract:
Adequate reflectance models are essential for the production of photorealistic images. Microfacet reflectance models predict the appearance of a material at the macroscopic level based on microscopic surface details. They provide a good match with measured reflectance in some cases, but not always. This discrepancy between the behavior predicted by microfacet models and the observed behavior has puzzled researchers for a long time. In this paper, we show that diffraction effects in the micro-geometry provide a plausible explanation. We describe a two-scale reflectance model, separating between geometry details much larger than wavelength and those of size comparable to wavelength. The former model results in the standard Cook-Torrance model. The latter model is responsible for diffraction effects. Diffraction effects at the smaller scale are convolved by the micro-geometry normal distribution. The resulting two-scale model provides a very good approximation to measured reflectances.
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