“A modified dipole-approximation considering optical depth to represent translucent materials” by Kim, Seo, Park, Lee, Cho, et al. …
Conference:
Type(s):
Title:
- A modified dipole-approximation considering optical depth to represent translucent materials
Presenter(s)/Author(s):
Abstract:
It is essential to determine adequate parameters for translucent materials to create realistic images considering the subsurface scattering effect. This is not intuitive since it depends on a complex nonlinear optical equation, a radiative transport equation. The most accurate way to find scattering parameters of the given translucent materials is to estimate them by fitting an equation for the subsurface scattering effect to measurement data obtained by using a set of optical devices. We propose a method to improve the existing image-based measurement by Jensen et al [H.W. Jensen 2001] in order to obtain more robust results and reduce the fitting error by controlling the optical depth of material.
References:
1. H. W. Jensen, S. R. Marschner, M. L. P. H. 2001. A practical model for subsurface light transport. In Proceedings of SIGGRAPH 2001, ACM Press / ACM SIGGRAPH, E. Fiume, Ed., Computer Graphics Proceedings, Annual Conference Series, ACM, 511–518.
2. L. V. Wang, S. J. 2000. Source of error in calculation of optical diffuse reflectance from turbid media using diffusion theory. Computer Methods and Programs in Biomedicine 61, 3, 163–170.
